DOI: 10.1063/5.0158663 ISSN:
A mini scanning device for profiling charged beams
P. Moretto-Capelle, E. Panader, L. Polizzi, J. P. Champeaux- Instrumentation
In this article, we present the development of a mini scanner device to characterize the full transverse spatial density of a charged particle beam using computed tomography. The profiler consists of a wire mounted on a linear translator that can rotate around the beam. Tests were performed on a millimeter electron beam with 200 eV energy and 100 nA intensity, which allowed us to control and monitor both beam focusing and deflection.