Tensor tomography of the residual stress field in graded-index YAG’s single crystals

Abstract

This work presents an application of tensor field tomography for non-destructive reconstructions of axially symmetric residual stresses in a graded-index YAG single crystal for the case of beam deflection. The axis of the cylinder coincides with the crystallographic axis [001] of the single crystal and it has an axially symmetric refractive index distribution. The transformation of the polarization of light is measured in a plane orthogonal to the axis of the cylinder. Stresses are determined within the framework of the Maxwell piezo-optic law (linear dependence of the permittivity tensor on stresses) and small rotation of quasi principal stress axes. This paper generalizes the method of integrated photoelasticity for the case of ray deflection.