DOI: 10.1039/d3ce00371j ISSN: 1466-8033
MROX 2.0: a software tool to explore quantum heterostructures by combining X-ray reflectivity and diffraction
S. Magalhães, C. Cachim, P. D. Correia, F. Oliveira, F. Cerqueira, J. M. Sajkowski, M. Stachowicz- Condensed Matter Physics
- General Materials Science
- General Chemistry
New software for the fitting of XRR measurements is developed. It is exemplified on 1 to 10 Si/Ge periods grown on Si template samples and on (001) substrates and one complex ZnO/Zn1−xMgxO superlattice grown on a m-ZnO substrate.