DOI: 10.3390/electronics12234863 ISSN: 2079-9292

A Novel Relocalization Method-Based Dynamic Steel Billet Flaw Detection and Marking System

Hongxing Zhou, Juan Chen, Qinghan Hu, Xue Zhao, Zhiqing Li
  • Electrical and Electronic Engineering
  • Computer Networks and Communications
  • Hardware and Architecture
  • Signal Processing
  • Control and Systems Engineering

In the current steel production process, occasional flaws within the billet are somewhat inevitable. Overlooking these flaws can compromise the quality of the resulting steel products. To address and mark these flaws for further handling, Magnetic Particle Testing (MT) in conjunction with machine vision is commonly utilized. This method identifies flaws on the billet’s surface and subsequently marks them via a device, eliminating the need for manual intervention. However, certain processes, such as magnetic particle cleaning, require substantial spacing between the vision system and the marking device. This extended distance can lead to shifts in the billet position, thereby potentially affecting the precision of flaw marking. In response to this challenge, we developed a detection-marking system consisting of 2D cameras, a manipulator, and an integrated 3D camera to accurately pinpoint the flaw’s location. Importantly, this system can be integrated into active production lines without causing disruptions. Experimental assessments on dynamic billets substantiated the system’s efficacy and feasibility.

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