DOI: 10.1116/6.0002765 ISSN:
XPS Al Kα and high energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk boron
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard- Surfaces, Coatings and Films
- Surfaces and Interfaces
- Condensed Matter Physics
Bulk boron was analyzed using both XPS and high-resolution high energy x-ray photoelectron spectroscopy. The spectra of boron obtained using monochromatic Al Kα radiation include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, and Ar 2p. The Cr Kα spectra with radiation at 5414.8 eV include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, Ar 2p, and Ar 1s.