DOI: 10.1002/adom.71965 ISSN: 2195-1071

Surface Fluorination of ALD Tin Oxide by SF 6 Plasma for Operationally Stable Perovskite Solar Cells

Nopporn Rujisamphan, Kay Thi Soe, Ratchadaporn Supruangnet, Thipusa Wongpinij, Waranchit Ruengsrisang, Anusit Kaewprajak, Pisist Kumnorkaew, Joongjai Panpranot, Thidarat Supasai

ABSTRACT

Colloidal tin oxide (c‐SnO x ) is the dominant electron transport layer (ETL) used in efficient n–i–p perovskite solar cells (PSCs), yet intrinsic oxygen‐related vacancies undermine operational stability. Here, we report a fluorinated SnO x electron transport layer (ETL) fabricated by SF 6 plasma‐assisted atomic layer deposition (ALD), in which plasma‐generated fluorine species chemisorb preferentially at oxygen vacancy (O v ) sites. Density functional theory calculations show that F and F − bind at a bridging O v with adsorption energies of −5.66 and −4.95 eV, respectively, whereas neutral SF 6 , SF 5, and SF 4 species bind weakly (−0.04 to −0.45 eV). Bader charge analysis confirms electron transfer from the SnO x surface to the adsorbed fluorine. Experimentally, the fluorination induces a surface dipole that shifts the vacuum level and elevates the work function without altering the intrinsic valence band onset of the F‐containing SnO x . This dipole‐induced vacuum level shift influences the interfacial energetics governing directional charge extraction and suppresses interfacial charge accumulation, which enhances device performance and operational stability. PSCs with SF 6 ‐plasma ALD SnO x achieve a power conversion efficiency of 21.0%, retaining 17.29% after 1400 h without encapsulation and sustaining stable power outputs for nearly 7000 min under continuous tracking. These results demonstrate superior performance and operational stability compared to thermal ALD‐grown SnO x without fluorination. The results establish plasma‐enabled interfacial fluorination as a strategy to engineer surface electrostatics and enhance the long‐term stability in perovskite photovoltaics.

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