DOI: 10.3390/mi17080923 ISSN: 2072-666X
Simulation Study of IGCT with Backside P-N Anode for Low Turn-Off Loss
Ling Li, Shiyu Ji, Xiaoguang Wei, Yaohua Wang, Qianqian Jiao, Liang Wang, Rui Liu, Xinling Tang, Ningfei Sun, Ningyi Wang, Xinyu Huo, Yaqi Gao, Jianye Ma, Ruifeng YueA reverse-blocking integrated gate-commutated thyristor (RB-IGCT) incorporating a backside PN junction, referred to as PN-RBIGCT, is proposed and investigated using Sentaurus TCAD. The introduction of the PN junction establishes a reverse electric field in the anode region during turn-off, which accelerates carrier extraction and reduces switching losses. At a conduction current of 5 kA, a 40.4% reduction in turn-off energy loss (from 335.6 J to 200.0 J) is achieved, with only a moderate increase in the on-state voltage drop of the PN-RBIGCT from 1.44 V to 1.62 V.