DOI: 10.1039/d6tc01556e ISSN: 2050-7526
Quantitative and artificial intelligence-enhanced conductive atomic force microscopy
Pravini S. Fernando, Jeffrey M. MativetskyThis review discusses advances in conductive atomic force microscopy (C-AFM) as a tool for quantitative nanoscale (opto)electronic characterization. It also highlights emerging AI-driven strategies for data analysis and measurement workflows.