DOI: 10.1017/s1759078726103808 ISSN: 1759-0787
Planar mmWave near-field antenna measurement system with multiple probes
Martin Obermaier, Johannes Lange, Thomas Deckert, Marc Vanden Bossche, Dirk PlettemeierAbstract
Planar near-field (NF) scanners are an essential tool to measure and characterize antennas. Their compact design and simple operation principle give them an advantage over classical far-field systems. This work presents a compact planar mmWave scanner, which implements an active probe array to achieve better and faster scans. The scanner architecture and the necessary steps to align the NF samples are discussed with a special focus on a novel concept to implement a probe compensation algorithm for multiple probes using a calibration antenna.