DOI: 10.1063/5.0353785 ISSN: 0021-9606

Momentum-resolved non-resonant inelastic x-ray scattering study of C60

Rui-Qi Tang, Jin-Feng Chen, Tao Xiong, Qing-Wen Gu, Yu-Jun Zhang, Zhi-Ying Guo, Shuo-Xue Jin, Wei Xu, Lin-Fan Zhu

For large molecular systems such as C60, accurate ab initio calculations remain challenging, making experimental methods a more reliable alternative. In this work, we employed the non-resonant inelastic x-ray scattering technique to study the electronic excitation dynamics of C60. The measurements spanned a momentum transfer range of 0.63–5.10 a.u. at a photon energy of ∼10 keV with an energy resolution around 1.0 eV. The dynamic structure factors in the excitation energy range of 5–500 eV and the generalized oscillator strengths for the core excitations of π*←1s were determined on absolute scales. A new feature at ∼24 eV was identified. In addition, the optical oscillator strengths were obtained by extrapolating the generalized oscillator strengths to zero momentum transfer, which show good agreement with the earlier x-ray absorption results. These findings demonstrate that the non-resonant inelastic x-ray scattering is a powerful technique for probing the electronic excitation process and extracting the corresponding dynamic parameters in complex molecular systems.