Modeling and Accelerated Test Validation of Separation Reliability for Detachable Electrical Connectors Under Long‐Term Storage

ABSTRACT

Aiming at the problem of separation reliability assessment of detachable electrical connectors under storage conditions, through failure analysis of detachable electrical connectors under a storage environment, it is revealed mechanically that stress relaxation of springs and contact jack reeds at ambient temperature is the cause of their separation failure. Based on the dislocation slip theory and the copper alloy relaxation dynamics equation, an accelerated degradation model considering the size of the springs and contact jack reeds was established. Based on the separation force as the performance index, combined with the separation performance degradation trajectory model and the central limit theorem, a statistical model for the separation reliability of detachable electrical connectors under storage conditions was established. Using the temperature stress accelerated degradation test data of the detachable electrical connector, the particle swarm optimization algorithm, AD test, and goodness of fit test methods were comprehensively applied to verify the rationality of the performance degradation trajectory model from the data statistical level, providing a theoretical basis for evaluating the separation reliability of the detachable electrical connector in the storage environment.