Metasurface‐Enabled Single‐Shot Intensity‐and‐Phase‐Interrogation Surface‐Plasmon‐Resonance Microscopy

ABSTRACT

Surface plasmon resonance (SPR) phase sensing exhibits exceptional sensitivity, but typically relies on complex optical configurations, limiting its widespread application in resonance imaging. Herein, we propose a simplified single‐shot intensity‐and‐phase microscopy platform that integrates a dielectric metasurface‐based full‐Stokes polarimeter into a phase‐interrogated SPR imaging system. Leveraging the differential responses of SPR to p‐ and s‐polarized illuminations, our non‐interferometric approach enables highly reliable reconstruction of analyte‐modulated Stokes parameters from a single camera exposure. These parameters enable simultaneous acquisition of the intensity ratio and differential phase, which play complementary roles in the sensing procedure: the intensity response is used to identify the resonance condition, whereas the differential phase provides the high‐sensitivity observable for quantitative RI or thickness retrieval. The platform demonstrates an estimated 1σ noise‐equivalent RI variation on the order of 10 ⁻⁵ RIU, nanometer‐scale thickness profiling, second‐level dynamic monitoring, parallel multi‐channel real‐time monitoring, robustness against environmental disturbances, and wavelength‐resolved sensing capability. By eliminating interferometric reference‐arm optics and simplifying polarization analysis, this SPR‐metasurface synergy establishes a robust, scalable framework for high‐sensitivity, label‐free biosensing and nanomaterial characterization.