Machine Learning Nonadiabatic Molecular Dynamics Reveals Key Influence of Topology of Oxygen Vacancies on Carrier Trapping and Recombination in SrTiO3
Tengxiang Wang, Zihang Liu, Dongyu Liu, Andrey S. Vasenko, Evgueni V. Chulkov, Jinlu He, Run Long, Oleg V. PrezhdoAbstract
Common defects in numerous systems, oxygen-vacancies (VO) shape trap states and govern charge carrier recombination, yet the role of their spatial topology remains poorly understood. We demonstrate, using machine-learning nonadiabatic molecular dynamics, a strong influence of VO dimer connectivity on charge carrier trapping and recombination in a widely used SrTiO3 oxide. Focusing on discrete (2 VO-D), bent (2 VO-B), and linear (2 VO-L) vacancy dimers, we show that strong interactions between VO vacancy complexes at high VO concentrations perturb the defect-state wave functions. All three configurations form shallow traps near the conduction-band minimum (CBM) and exhibit similar nonradiative recombination with lifetimes of hundreds to thousands of nanoseconds. At low VO concentrations, the intrinsic topology becomes decisive. The 2 VO-D and 2 VO-B configurations retain spatially distributed and asymmetric defect states, and remain shallow, whereas the symmetric 2 VO-L configuration stabilizes a localized in-gap state through enhanced Ti-centered orbital hybridization. This deep trap opens an efficient CBM → trap → VBM (valence band minimum) pathway and markedly accelerates nonradiative recombination. The results establish vacancy topology and defect-wave function symmetry as key microscopic determinants of trap depth and carrier lifetime, while highlighting the importance of sufficiently large models for realistic defect-dynamics simulations.