Influence of Deposition Temperature on the Optical, Morphological and Structural Properties of SiPc and AlPc Thin Films Prepared by CSS Technique
Vadim Morari, Radu Tigoianu, Daniel Timpu, Carmen Gherasim, Victor Suman, Lidia Ghimpu, Ion Lungu, Elena Laura Ursu, Florica Doroftei, Anton AirineiThis study presents a comprehensive investigation of the structural, morphological, and optical properties of aluminum phthalocyanine (AlPc) and silicon phthalocyanine (SiPc) thin films prepared by the close space sublimation (CSS) method, deposited at different evaporator temperatures of 350 °C, 400 °C, and 450 °C, including heterostructures incorporating an indium tin oxide (ITO) layer. Scanning electron microscopy revealed a clear temperature-dependent evolution of surface morphology, with both materials transitioning from isolated crystallites to dense, highly crystalline films. SiPc exhibited higher nucleation density and earlier film densification, while AlPc showed more pronounced grain growth at elevated temperatures, accompanied by crack formation due to internal stress. Optical absorption spectra indicated a red shift in absorption maxima with increasing deposition temperature, associated with improved crystallinity and reduced defect density. The presence of ITO significantly modified the optical response, introducing additional absorption features in the near-infrared region due to interference effects and free-carrier contributions. Fluorescence measurements revealed enhanced emission intensity with increasing temperature for AlPc, while SiPc showed weaker emission overall. The incorporation of ITO led to substantial fluorescence enhancement and the appearance of additional near-infrared emission bands, highlighting the importance of interface engineering. Transmittance spectra demonstrated that ITO-based heterostructures provide a balance between transparency and absorption, with selective attenuation in the 600–800 nm range, enabling band-stop filter behavior. Raman analysis revealed opposite temperature-dependent trends: increasing structural order in AlPc and gradual disorder in SiPc. X-ray diffraction confirmed the crystalline nature of both materials, showing temperature-induced improvements in crystallinity and crystallite size, as well as distinct differences in molecular packing and preferred orientation. These results demonstrate the potential of AlPc and SiPc thin films as functional optical materials with tunable structural and optical properties.