DOI: 10.1039/d6ra03113g ISSN: 2046-2069
In situ transmission electron microscopy characterization of MXene interfaces: a review
Wenzhao Wang, Ning CaoThis review highlights the advantages of transmission electron microscopy (TEM) for atomic-scale characterization of MXene intrinsic and heterojunction interfaces, with special emphasis on in situ TEM for capturing dynamic structural evolution.