Fast Process Development Made Possible Using an Easy to Duplicate Integrated Microfluidic Platform

Selective and efficient purification methods are needed to recover metals from wastes with highly variable and complex compositions, such as printed circuit boards (PCBs). Fast process development is a key requirement for their development due to the rapid variability in waste composition and target metal content from one batch to another. Here, we report an easy‐to‐replicate integrated microfluidic platform enabling rapid process development, exemplified in the case of a nanosheet‐based highly silver‐selective membrane. The system combines controlled microfluidic injection, a tangential‐flow membrane module, and inline commercial X‐ray fluorescence detection within a unified architecture, allowing real‐time quantification of metal ion transport under precisely regulated flow conditions. Using a membrane incorporating phosphatoantimonic acid (H ₃ Sb ₃ P ₂ O ₁₄ ), we demonstrate preferential silver transfer from nitric‐acid leachates of real silver‐rich waste electronic components. The platform enables accurate and inline permeation monitoring while drastically reducing reagent consumption and experimental time compared with conventional batch methods. Moreover, machine learning allowed predicting silver concentrations with good generalization ability to unknown flow rates, which constitutes an additional step toward autonomous process optimization. Overall, this second generation of microfluidic platforms provides an efficient tool for fast process development, accelerated material screening, and optimization of environmentally beneficial recycling pathways.