DOI: 10.31399/asm.edfa.2023-3.p023 ISSN: 1537-0755

Failure Analysis of Photonic Integrated Circuits

Frieder H. Baumann, Brian Popielarski, Ryan Sweeney, Felix Beaudoin, Ken Giewont
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

Abstract

This article introduces silicon photonics, describes what is needed for photonics failure analysis, and shows examples of analysis results for failures in modern silicon photonics circuits.

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