DOI: 10.31399/asm.edfa.2023-3.p023 ISSN: 1537-0755
Failure Analysis of Photonic Integrated Circuits
Frieder H. Baumann, Brian Popielarski, Ryan Sweeney, Felix Beaudoin, Ken Giewont- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
Abstract
This article introduces silicon photonics, describes what is needed for photonics failure analysis, and shows examples of analysis results for failures in modern silicon photonics circuits.