Electric field measurements at interfaces of insulating and conducting materials using simultaneous temperature and space charge-induced responses with thermal method

This paper is concerned with the measurement of electric fields at metal/insulator and metal/semiconductor interfaces using the thermal pulse method for space charge measurements. Simultaneous responses induced by the space charges and the variation of the surface temperature of samples are acquired, treated, and used. It is shown that and how through thorough and full decoupling and exploitation of such signals issued from an appropriate experimental setup, the values of the metal/polymer interface fields can be reached. On the other hand, the applicability of thermal methods for detecting charges at the interfaces of semiconducting materials is fully demonstrated.