Effects of layer number on structural, morphological and optoelectronic properties of ZnS/Au-based multilayer films

ZnS/Au-based transparent conductive films with different layer numbers were fabricated on quartz glass substrates at room temperature via an advanced pulsed laser deposition (PLD) technique. The effects of layer number on the microstructure, surface morphology, and optoelectronic properties of the ZnS/Au-based multilayer films were systematically investigated using various modern analytical and testing methods, including X-ray diffraction (XRD), scanning electron microscopy (SEM), ultraviolet-visible (UV–Vis) spectrophotometer, and a four-probe instrument. The results demonstrate that the ZnS/Au two-layer films exhibit poor optoelectronic performance. In contrast, the ZnS/Au/ZnS three-layer films achieve an average transmittance of approximately 89% in the wavelength range of 300–800[Formula: see text]nm, a sheet resistance of 36.4[Formula: see text] [Formula: see text] [Formula: see text]sq[Formula: see text], and a maximum figure of merit (FOM) of [Formula: see text] [Formula: see text] [Formula: see text] in the visible light band. When the film layer number is increased to five (ZnS/Au/ZnS/Au/ZnS), the average transmittance in the visible light region is about 83%, the sheet resistance increases to 38.8[Formula: see text] [Formula: see text] [Formula: see text]sq[Formula: see text], and the figure of merit is enhanced in the 550–800[Formula: see text]nm wavelength range. These findings indicate that both the ZnS/Au/ZnS three-layer films and ZnS/Au/ZnS/Au/ZnS five-layer films possess excellent optoelectronic properties, rendering them applicable to a variety of fields in optoelectronic devices.