DOI: 10.3390/electronics15163502 ISSN: 2079-9292
Derivation of Neutron SEE Cross-Section Energy Dependence from White Neutron Irradiation Experiments at CSNS-ANIS
Xu Ma, Jinhua Han, Gang Guo, Jiancheng Liu, Qiming Chen, Junyuan Tan, Fuqiang Zhang, Shaoqing DengWhite neutron Single Event Effect (SEE) cross-sections were measured for two Static Random Access Memories (SRAMs) on the Atmospheric Neutron Irradiation Spectrometer at the China Spallation Neutron Source, and we applied the unfolding technique using a particle swarm optimization algorithm to extract the neutron energy dependence of SEE cross-sections from the experimental data. The calculated results agree well with the experimental data, validating this method. This method demonstrates how white neutron SEE experimental data can be effectively used with unfolding techniques to obtain the neutron energy dependence of SEE cross-sections for microelectronic devices.