DOI: 10.3390/s26165124 ISSN: 1424-8220
Correction: Amato et al. Detecting Important Features and Predicting Yield from Defects Detected by SEM in Semiconductor Production. Sensors 2025, 25, 4218
Umberto Amato, Anestis Antoniadis, Italia De Feis, Anastasiia Doinychko, Irène Gijbels, Antonino La Magna, Daniele Pagano, Francesco Piccinini, Easter Selvan Suviseshamuthu, Carlo Severgnini, Andres Torres, Patrizia VasquezIn the published publication [...]