Characterization of LTCC Material at G-band

New data on the properties of dielectrics normally used in planar circuits, along with a technique for characterizing dielectric materials at high millimetre-wave frequencies, are presented. Comparative data are presented on the dielectric constant ( ε r) and loss tangent (tan δ) for different types of LTCC substrate. A free-space technique was used

for the evaluation of dielectrics. The measurement data provided useful information on the permittivity and losses in materials at high mm-wave frequencies.