DOI: 10.1145/3808156 ISSN: 2994-970X

Boosting LLMs for Mutation Generation

Bo Wang, Ming Deng, Mingda Chen, Chengran Yang, Youfang Lin, Mark Harman, Mike Papadakis, Jie M. Zhang

LLM-based mutation testing is a promising testing technology, but existing approaches typically rely on a fixed set of mutants as few-shot examples or none at all. This can result in generic low-quality mutants, missed context-specific mutation patterns, substantial numbers of redundant and non-compilable mutants, and limited semantic similarity to real bugs. To overcome these limitations, we introduce SMART (Semantic Mutation with Adaptive Retrieval and Tuning). SMART integrates retrieval-augmented generation (RAG) on a vectorized dataset of real-world bugs, focused code chunking, and supervised fine-tuning using mutants coupled with real-world bugs. We conducted an extensive empirical study of SMART using 1,991 real-world Java bugs from the Defects4J and ConDefects datasets, comparing SMART to the state-of-the-art LLM-based approaches, LLMut and LLMorpheus. The results reveal that SMART substantially improves mutation validity, effectiveness, and efficiency (even enabling 7B-scale models to match or even surpass large models like GPT-4o). We also demonstrate that SMART significantly improves downstream software engineering applications, including test case prioritization and fault localization. More specifically, SMART improves validity (weighted average generation rate) from 42.89% to 65.6%. It raises the non-duplicate rate from 87.38% to 95.62%, and the compilable rate from 88.85% to 90.21%. In terms of effectiveness, it achieves a real bug detection rate of 92.61% (vs. 57.86% for LLMut) and improves the average Ochiai coefficient from 25.61% to 38.44%. For fault localization, SMART ranks 64 more bugs as Top-1 under MUSE and 57 more under Metallaxis.

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