DOI: 10.1039/d6ra02763f ISSN: 2046-2069
Automated SEM-based nanoparticle metrology for materials characterization via segmentation and robust scale-bar recognition
Xueyi Huang, Yuzhong Yin, Jinghao Hu, Wenxiao Yu, Liang Fang, Jian Liu, Dongdong LiQuantitative nanoparticle metrology is essential for establishing structure–property relationships in catalysis, drug delivery, optoelectronic materials, battery materials, and synthesis optimization.