DOI: 10.1039/d6ay00952b ISSN: 1759-9660

An area-based model for estimating vitrinite reflectance of micro-sized particles

Yanwei Bi, Hongbiao Wang, Chunlong Liu, Hongliang Dang, Xingxuan Lei, Chao Xia, Yinbo Xu, Pingchang Sun

A Weibull-based area normalization model estimates true vitrinite reflectance from background-interfered mixed optical signals.

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