DOI: 10.31399/asm.edfa.2023-3.p004 ISSN: 1537-0755
Advancements in Image Pattern Recognition for Lock-In Thermography Hotspot Detection and Classification with Supervised Learning
Kyu Kyu Thinn, Teh Tict Eng, Ming Xue, Rui Zhen Tan- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
Abstract
Lock-in thermography (LIT) is a widely used nondestructive tool for detecting the failure location in integrated circuits. The image pattern recognition algorithm for detecting LIT hotspots benefits image processing and can be leveraged to automate failure analysis processes.