A Standardized Platform for QLED Fabrication and Characterization

Abstract

In recent years, quantum dot light-emitting diodes (QLEDs) have achieved record-high performance, driven by rapid advances in active materials and device engineering. However, fabrication remains a significant barrier for new researchers entering the field, and variability in measurement techniques complicates direct comparison of device performance. Here, we establish a standardized and reproducible protocol for QLED fabrication and characterization, designed to lower the technical threshold, improve experimental reliability, and ensure accurate performance assessment. The protocol was independently validated by researchers with different levels of experience. In addition, we provide detailed troubleshooting guidelines and identify key sources of variability in QLED devices. By integrating electron transport material synthesis, optimized thin-film processing, and standardized device characterization procedures, this protocol ensures consistent device performance and promotes broader adoption of QLED technology across the research community.