A Large‐Current High‐Reliability IGBT Driver IC With ADC for Miller Plateau Sample

ABSTRACT

This paper presents a high‐reliability large‐current active gate driver integrated chip for IGBTs. As the IGBT switching frequencies and edge rates increase, the issues caused by parasitic elements such as overshoot, oscillation and EMI in IGBT drivers become increasingly severe. As the IGBT switching frequencies and edge rates increase, the issues caused by parasitic elements such as overshoot, oscillation, and EMI in the IGBT driver become increasingly severe. To address the issues, this paper proposes a segmented drive control scheme based on the detection of the slope of the IGBT gate voltage and the Miller plateau values. The circuit integrates an internal ADC for voltage sampling, a slope detection module, feedback control and a large‐current driver. Moreover, it can adaptively adjust the segmentation process according to different IGBTs and inductance loads. Reliability is improved via integrated multi‐fault detection and protection schemes. Specifically, for short‐circuit protection, an adaptive strategy merging two‐level turn‐off with soft shutdown is designed. This approach ensures efficient fault mitigation while maintaining device safety. Test results show that the current rising slope is reduced by 10% and the voltage overshoot is reduced by 76.9% during the switching process compared with the traditional scheme. A variety of fault detection and corresponding fault handling techniques can ensure the safety and reliability of the entire system.