DOI: 10.1002/sdtp.16580 ISSN:
29‐5: Invited Paper: Progress in MicroLEDs: Materials, Device Performance, and Reliability
Brendan Moran, Mark J. Holmes, Joseph Flemish, Robert Armitage, Zhongmin Ren, Hossein Lotfi, Theodore Chung, Hee Jin Kim, Hisashi Masui, Rajiv Pathak, Jia Cheng Tan, Boon Hon Tan, Yongxiang Melvin Tio, Shimin Lim, Kheng Boo Lim, Oleg Shchekin- General Medicine
We present state of the art for microLED materials, devices, and reliability. We show performance efficiencies as a function of current density and device size for InGaN Red, Green, and Blue and AlInGaP Red materials and breakdown EQE into constituent IQE and extraction efficiency. We also present reliability results for these structures across all materials systems. We then review several concurrently developed technologies that serve to maximize microLED performance in application use.