DOI: 10.1002/sdtp.16503 ISSN:
11‐1: AI‐based Interaction Commonality Analysis
Soyeong Park, Misuk Kim, Seokhyun Yoon, Nayeon Hwang, Jung-suk Bae, Myeonghwa Kim, Jeehun Seo, Dooyoul Lee, Jung-Tae Kang, Jeong-il Yoo- General Medicine
As display technology advances, display manufacturing processes are getting complicated. Therefore, the origins of failures are not always from one process. Under the circumstances, applying the conventional statistical methods to commonality analysis of multifaceted processes is difficult because the number of cases to be considered is millions. Herein, we propose an effective method for interaction commonality analysis of display failures using artificial intelligence, enabling to successfully achieve 90% detection performance.