Hysteresis in the temperature dependence of the yield point of silver single crystals within the low-temperature range

The temperature dependence of the yield point τ0 is analyzed for single crystals of silver and a silver alloy, on the basis of tests by repetitive loading to the yield point with subsequent cooling (conventional method) and subsequent heating. An appreciable amount of hysteresis is found in the function τ0(T), depending on the direction of temperature changes. Possible causes of this hysteresis are explored and the conclusion is arrived at that it may have to do with changes in the rate of dislocation proliferation and the attendant changes in the dislocation structure.